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Department Archives Remove constraint Department: Archives Genre Photographs Remove constraint Genre: Photographs Creator Bendix Corporation Remove constraint Creator: Bendix Corporation

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    • 1957

    General view of an ion source and Model 201 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source…

    • 1957

    Close-up view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

    • 1958

    General view of a Bendix Model MB-105-G2 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of a mass spectrometer's ion source, the magnetic electron multiplier…

    • 1958

    General view of an ion source and Model 203-GGA Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion…

    • 1958

    Three photographs of a Bendix Model 104 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of a mass spectrometer's ion source, the magnetic electron multiplier…

    • 1958

    Series of photographs depicting an ion source and Model 202-G2 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. Several of the photographs are annotated with…

    • 1958

    Two views of an ion source and Model 301 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source…

    • 1958

    Close-up view of a Bendix Model 301 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of the mass spectrometer's ion source, the magnetic electron multiplier is…

    • 1958

    Close-up view of a Bendix Model 302 Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of the mass spectrometer's ion source, the magnetic electron multiplier is…

    • 1958

    Two close-up views of a Bendix Model 303 miniature right-angle Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. A component of the mass spectrometer's ion source, the…

    • 1958

    General view of an ion source and Model 304 replaceable cathode ultraviolet Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a…

    • 1959

    General view of a trade display showcasing the Bendix Model 14-101 Time-of-Flight Mass Spectrometer, with view of the oscilloscope attachment and various control panels. The Time-of-Flight Mass Spectrometer (TOFMS) was…

    • 1959

    Two views of an ion source and Model 105-G3 Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source…

    • 1959

    General view of an ion source and Model 203-GGB Magnetic Electron Multiplier designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion…

    • 1960s

    Schematic diagram depicting energy focusing in a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

    Mass spectrometry…

    • 1960s

    Schematic diagram comparing the time-of-flight of an ion to its initial position in a Bendix Time-of-Flight Mass Spectromter. Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's…

    • 1960s

    General view of an unidentified accessory likely intended for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

    • 1960s

    Multiple views of the interior and exterior of the Bendix Model 1030 Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell…

    • 1960s

    Close-up view of the isolation valve apparatus for a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen…

    • 1960s – circa

    Series of photographs depicting the Bendix MA-1A Time-of-Flight Mass Spectrometer and a female model. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

    Mass…

    • 1960s – circa

    General view of a Bendix RGA-1A Time-of-Flight Residual Gas Analyzer with female model. The Bendix RGA-1 was specifically designed and marketed to enable accurate determination of the total pressure of a vacuum chamber…

    • 1960s – circa

    Two views of a prototype of the Bendix MA-2 Time-of-Flight Mass Spectrometer, with a close-up of assorted control panels showing controls for the ionization gauge, inlet system pumping valve, thermocouple station, and…

    • 1960s

    Series of photographs depicting the Bendix Corporation Gas Chromatograph 2500 and Time-of-Flight Mass Spectrometer with a male technician. Assorted control panels are visible in the photograph, including an isothermal…

    • 1960s

    Promotional display depicting the Bendix Corporation Mass Spectroscopy handling system. One of four component parts of a mass spectrometer, the handling system is used to introduce an unknown substance into the…

    • 1960s

    Diagram depicting air spectrum on scope, showing readings for nitrogen gas, oxygen, and carbon dioxide. This diagram is likely the output of a Bendix Corporation Time-of-Flight Mass Spectrometer, an instrument commonly…