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    • 1980s

    Aerial view of the Dow Chemical Company's polystyrene plant located in Cartagena, Columbia. Constructed in the 1960s, the Cartagena plant subsequently underwent four expansions and boasted a manufacturing capacity of…

    • 1980s

    Aerial view of the Dow Chemical Company's polystyrene plant located in Cartagena, Columbia. Constructed in the 1960s, the Cartagena plant subsequently underwent four expansions and boasted a manufacturing capacity of…

    • 1980s

    Aerial view of a section of the Dow Chemical Company's polystyrene plant located in Cartagena, Columbia. Constructed in the 1960s, the Cartagena plant subsequently underwent four expansions and boasted a manufacturing…

    • 1980s

    Aerial view of the Dow Chemical Company plant facilities located in Midland, Michigan with a view of the adjoining Tittabawassee River.

    • 1989-Oct-18

    Arnold O. Beckman at the White House with President George H. W. Bush, receiving the National Medal of Science "for his leadership in the development of analytical instrumentation, and for his deep and abiding concern…

    • 1988

    Interior view of the Analytical Laboratory at the Dow Chemical Company facilities in Midland, Michigan. Assorted analytical instruments and computational equipment is visible throughout the laboratory, including a…

    • 1988

    Aerial view of the Analytical Laboratory at the Dow Chemical Company facilities in Midland, Michigan. Three employees are visible on the ground floor of the laboratory, surrounded by assorted analytical instruments and…

    • circa 1987

    General view of a section of the Dow Chemical Company's Louisiana Gasification Technology Inc. (LGTI) facility located in Plaquemine, Louisiana. Opened in 1987, the LGTI facility was a coal-gasification plant that…

    • 1986-Sep

    General exterior view of the West Side Power House at the Dow Chemical Company plant located in Midland, Michigan.

    • 1970s

    Two views of a Model MA-026 Mass Sequencer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…

    • 1970s

    Multiple views of the interior of a Bendix Corporation Model MA-030 Mass Marker designed for use with a Bendix Time-of-Flight Mass Spectrometer, with view of assorted circuits and wires. The Time-of-Flight Mass…

    • 1970s

    Three views showing the interior and exterior of a glass inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion…

    • 1970s

    Two close-up views of the vacuum system attachment designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…

    • 1970s

    Close-up view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…

    • 1970s

    General view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

    • 1970s

    Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

    • 1970s

    Three views of an unidentified technician utilizing a Bendix Corporation Model 2500 Gas Chromatograph and Model MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…

    • 1970s

    Two close-up views of the back of an unidentified scientific apparatus, likely an accessory for a Bendix Time-of-Flight Mass Spectrometer, with view of assorted electrical cables and wires.

    • 1970s

    General view of a Bendix Corporation MA-011 Variable Oscillator designed for use with a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

    • 1970s

    Close-up view of the control panel for a Bendix Corporation Model MA-3 Vacuum System designed for use with the Bendix Time-of-Flight Mass Spectrometer. An ionization gauge, foreline valve, and assorted attachments are…

    • 1970s

    General view of assorted components of a Bendix Time-of-Flight Mass Spectrometer system, including an oscilloscope, inlet system, and ion source. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…

    • 1970s

    Close-up view of the interior of an unidentified Bendix Corporation apparatus, likely a component of or accessory for a Time-of-Flight Mass Spectrometer, with view of various circuit boards and plugs. The Time-of-Flight…

    • 1970s

    Close-up view of the interior of an ion source for a Bendix Time-of-Flight Mass Spectrometer, with view of the ion grid and various circuit boards and plugs. One of four component parts of a mass spectrometer, the ion…

    • 1970s

    Close-up view of the control panel of an oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer, the flagship instrument of the Bendix Corporation. An oscilloscope is a laboratory instrument…

    • 1970s

    Four general views of the exterior and interior of a Bendix Model MA-015 Differential Pumping System and assorted control panels for various accessories attached to a Bendix Model MA-02 Time-of-Flight Mass Spectrometer…