Skip to Content
You searched for
Search
Genre Photographs Remove constraint Genre: Photographs Genre Charts, diagrams, etc Remove constraint Genre: Charts, diagrams, etc Subject Bendix Corporation Remove constraint Subject: Bendix Corporation

Search Constraints

Search Results

    • 1960s

    Schematic diagram comparing the time-of-flight of an ion to its initial position in a Bendix Time-of-Flight Mass Spectromter. Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's…

    • 1960s

    Schematic diagram depicting energy focusing in a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

    Mass spectrometry…

    • 1960s

    Schematic diagram depicting the total output integrator time sequence of a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

    • 1960s

    Schematic diagram illustrating the thermal ionization spectrum of sodium and potassium. This diagram was likely produced using a Bendix Corporation thermal ionization probe, which, as part of the Bendix Time-of-Flight…

    • 1960s

    Schematic diagram depicting the typical background spectrum reading for a Bendix Time-of-Flight Mass Spectrometer with a thermal ionization probe in place. As part of the Bendix system, the thermal ionization probe…

    • 1960s

    Schematic diagram of a Bendix Model 843T Thermal Ionization Probe designed for use with the Bendix Time-of-Flight Mass Spectrometer. This surface ionization inlet system provided a means of creating ions for spectral…

    • 1970s

    Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

    • 1960s

    Diagram of a Bendix Corporation Model 843A Direct Inlet System with view of assorted component parts, including a crucible, filament, vacuum system header, and sample probe. Inlet systems are typically used to introduce…