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    • 1980s

    Three views of a System Industries System/150 unit and accessories, including a computer monitor, keyboard, and printer. This unit may have been intended for use with a Bendix Corporation Time-of-Flight Mass…

    • 1982-Mar

    General view of a Consolidated Vacuum Corporation Model 2000 Mass Spectrometer, with view of the output scanner, oscilloscope, and assorted control panels and wires. Also known as CVC Products Inc., Consolidated Vacuum…

    • 1970s

    Two views of a Model MA-026 Mass Sequencer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…

    • 1970s

    Multiple views of the interior of a Bendix Corporation Model MA-030 Mass Marker designed for use with a Bendix Time-of-Flight Mass Spectrometer, with view of assorted circuits and wires. The Time-of-Flight Mass…

    • 1970s

    Three views showing the interior and exterior of a glass inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion…

    • 1970s

    Two close-up views of the vacuum system attachment designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…

    • 1970s

    Close-up view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…

    • 1970s

    General view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

    • 1970s

    Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

    • 1970s

    Three views of an unidentified technician utilizing a Bendix Corporation Model 2500 Gas Chromatograph and Model MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…

    • 1970s

    Two close-up views of the back of an unidentified scientific apparatus, likely an accessory for a Bendix Time-of-Flight Mass Spectrometer, with view of assorted electrical cables and wires.

    • 1970s

    Diagram depicting the pulsed ionization operation of a Bendix Corporation Time-of-Flight Mass Spectrometer. Ionization is the process by which an atom or a molecule acquires a negative or positive charge by gaining or…

    • 1970s

    Diagram depicting the continuous ionization operation of a Bendix Corporation Time-of-Flight Mass Spectrometer. Ionization is the process by which an atom or a molecule acquires a negative or positive charge by gaining…

    • 1970s

    Diagram depicting several sample inlet systems, including the fast reaction pinhole inlet, molecular beam inlet, and sample inlet tube, designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are…

    • 1970s

    Diagram depicting standard and fast reaction ion sources for a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. One of four component parts of a mass spectrometer,…

    • 1970s

    Schematic diagram depicting the ion source and vacuum system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. One of four component parts of…

    • 1970s

    Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

    • 1970s

    Schematic diagram depicting the vacuum system for a Bendix Model 12-101 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

    • 1970s

    General view of a Bendix Corporation MA-011 Variable Oscillator designed for use with a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

    • 1970s

    Close-up view of the control panel for a Bendix Corporation Model MA-3 Vacuum System designed for use with the Bendix Time-of-Flight Mass Spectrometer. An ionization gauge, foreline valve, and assorted attachments are…

    • 1970s

    General view of assorted components of a Bendix Time-of-Flight Mass Spectrometer system, including an oscilloscope, inlet system, and ion source. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…

    • 1970s

    Close-up view of the interior of an unidentified Bendix Corporation apparatus, likely a component of or accessory for a Time-of-Flight Mass Spectrometer, with view of various circuit boards and plugs. The Time-of-Flight…

    • 1970s

    Close-up view of the interior of an ion source for a Bendix Time-of-Flight Mass Spectrometer, with view of the ion grid and various circuit boards and plugs. One of four component parts of a mass spectrometer, the ion…

    • 1970s

    Close-up view of the control panel of an oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer, the flagship instrument of the Bendix Corporation. An oscilloscope is a laboratory instrument…

    • 1970s

    Four general views of the exterior and interior of a Bendix Model MA-015 Differential Pumping System and assorted control panels for various accessories attached to a Bendix Model MA-02 Time-of-Flight Mass Spectrometer…