TY - MANSCPT DB - Science History Institute DP - Science History Institute M2 - Courtesy of Science History Institute. Rights: No Known Copyright TI - Diagram of sample inlet systems for Bendix Mass Spectrometer ID - m326m210m AU - Bendix Corporation DA - 1970/// YR - 1970 AV - Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2 VL - Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2 AN - Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2 UR - https://digital.sciencehistory.org/works/m326m210m AB - Diagram depicting several sample inlet systems, including the fast reaction pinhole inlet, molecular beam inlet, and sample inlet tube, designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation. KW - Scientific apparatus and instruments KW - Mass spectrometers KW - Mass spectrometry KW - Time-of-flight mass spectrometry KW - Bendix Corporation KW - Spectrometer industry LA - ER -