Interior views of Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
Rights
No Known CopyrightDownload all 2 images
PDFZIPof full-sized JPGsDownload selected image
Small JPG1200 x 983px — 181 KBLarge JPG2880 x 2360px — 756 KBFull-sized JPG4378 x 3588px — 1.5 MBOriginal fileTIFF — 4378 x 3588px — 45.0 MBTwo partial views of the interior of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of the hot filament sample system control and assorted pumps. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical technique used to identify qualitatively and quantitatively the atomic and molecular composition of inorganic and organic materials by sorting ions according to their mass-to-charge ratios. Mass spectrometers consist of four basic parts: a handling system used to introduce the unknown sample into the equipment; an ion source, in which a beam of particles characteristic of the sample is produced; an analyzer that separates the particles according to mass; and a detector, in which the separated ion components are collected and characterized.
Property | Value |
---|---|
Creator of work | |
Format | |
Genre | |
Extent |
|
Subject | |
Rights | No Known Copyright |
Credit line |
|
Institutional location
Department | |
---|---|
Collection | |
Physical container |
|
Related Items
Cite as
Bendix Corporation. “Interior Views of Bendix MA-2 Time-of-Flight Mass Spectrometer,” 1960–1969. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 1. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/0r967392t.
This citation is automatically generated and may contain errors.