Close-up view of the ion source and ion gauge for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Bendix Corporation. “Ion Source and Ion Gauge for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 3. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/5m60qs44g.
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