Close-up partial view of the ion source and vacuum system attachment designed for use with a Bendix Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze the waveform of electronic signals, is partially visible on the right-hand side of the apparatus. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Bendix Corporation. “Ion Source and Vacuum System for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/7w62f869r.
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