Close-up view of the interior of an unidentified Bendix Corporation apparatus, likely a component of or accessory for a Time-of-Flight Mass Spectrometer, with view of various circuit boards and plugs. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
|Creator of work|
|Original file type||TIFF|
|Rights||No Known Copyright|
|View in library catalog|
Bendix Corporation. “Interior View of Bendix Corporation Apparatus,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/bv73c0801.
This citation is automatically generated and may contain errors.
RightsNo Known Copyright
Download selected image
Previous image shift + or , Next image shift + or . Pan image Zoom in + or shift + Zoom out - or shift + Zoom to fit 0 Close viewer esc Also
Mouse click to zoom in; shift-click to zoom out. Drag to pan. Pinch to zoom on touch.