Schematic diagram depicting the ion source and vacuum system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Bendix Corporation. “Diagram Depicting Ion Source and Vacuum System,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/h702q674x.
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