Bendix MA-2 Time-of-Flight Mass Spectrometer
- Circa 1970
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Small JPG1200 x 983px — 157 KBLarge JPG2880 x 2360px — 670 KBFull-sized JPG4265 x 3495px — 1.3 MBOriginal fileTIFF — 4265 x 3495px — 42.7 MBTwo views of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of assorted accessories and components, including the ion source, vacuum system, and output scanner. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical technique used to identify qualitatively and quantitatively the atomic and molecular composition of inorganic and organic materials by sorting ions according to their mass-to-charge ratios. Mass spectrometers consist of four basic parts: a handling system used to introduce the unknown sample into the equipment; an ion source, in which a beam of particles characteristic of the sample is produced; an analyzer that separates the particles according to mass; and a detector, in which the separated ion components are collected and characterized.
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Cite as
Bendix Corporation. “Bendix MA-2 Time-of-Flight Mass Spectrometer,” circa 1970. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/m039k5382.
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