Component of ion source for Bendix Mass Spectrometer
- 1970s
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Small JPG1200 x 1458px — 138 KBLarge JPG2880 x 3500px — 699 KBFull-sized JPG3492 x 4244px — 985 KBOriginal fileTIFF — 3492 x 4244px — 42.5 MBMultiple close-up views of a component part, possibly accelerating grids, of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four primary components of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Cite as
Bendix Corporation. “Component of Ion Source for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/pn89d694n.
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