Grid ion source for Bendix Mass Spectrometer
- 1973-Jun

Rights
Download all 4 images
PDFZIPof full-sized JPGsDownload selected image
Small JPG1200 x 1455px — 163 KBLarge JPG2880 x 3492px — 938 KBFull-sized JPG3500 x 4244px — 1.3 MBOriginal fileTIFF — 3500 x 4244px — 42.5 MBMultiple close-up views of the grid ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
Property | Value |
---|---|
Creator of work | |
Format | |
Genre | |
Extent |
|
Subject | |
Rights | No Known Copyright |
Credit line |
|
Institutional location
Department | |
---|---|
Collection | |
Physical container |
|
View collection guide View in library catalog
Related Items
Cite as
Bendix Corporation. “Grid Ion Source for Bendix Mass Spectrometer,” June 1973. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/zk51vh18n.
This citation is automatically generated and may contain errors.