Grid ion source for Bendix Mass Spectrometer
- 1973-Jun
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Small JPG1200 x 1455px — 163 KBLarge JPG2880 x 3492px — 938 KBFull-sized JPG3500 x 4244px — 1.3 MBOriginal fileTIFF — 3500 x 4244px — 42.5 MBMultiple close-up views of the grid ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Cite as
Bendix Corporation. “Grid Ion Source for Bendix Mass Spectrometer,” June 1973. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/zk51vh18n.
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