Ion source for Bendix Mass Spectrometer
- 1960s
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Small JPG1200 x 983px — 90.0 KBLarge JPG2880 x 2360px — 446 KBFull-sized JPG4378 x 3588px — 915 KBOriginal fileTIFF — 4378 x 3588px — 45.0 MBClose-up view of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Cite as
Bendix Corporation. “Ion Source for Bendix Mass Spectrometer,” 1960–1969. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 1. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/9p290952r.
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