Detail view of an ion source for a Bendix Model MA-2 Time-of-Flight Mass Spectrometer, with view of the one-quarter inch ionization region. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
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Bendix Corporation. “Ion Source for Bendix Mass Spectrometer,” circa 1971. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/ft848r00d.
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