Two views of a sample being injected into the heated graphite atomizer (HGA) of a Perkin-Elmer atomic absorption spectrophotometer in use at the quality control laboratory of the General Instrument Corporation in Hicksville, New York. Per notations accompanying the photographs, the laboratory is testing for metal contaminants in the packaging of semiconductors, which can cause malfunction and eventual failure of the semiconductors produced by the Corporation.
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Perkin-Elmer Corporation. “Heated Graphite Atomizer in Use at General Instruments Corporation Laboratory,” 1970–1979. Photographs from the Perkin-Elmer-Applera Collection, Box 6. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/qj72p806k.
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