General view of the direct inlet probe system designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the system include a vacuum system header, filament, crucible, and sample probe. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The direct inlet system is designed for sensitive analysis of solids at high temperatures and is commonly used for the identification and study of organic compounds, particularly tiny samples.
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Bendix Corporation. “Direct Inlet Probe System for Bendix Mass Spectrometer,” 1960–1969. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 1. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/w9505061m.
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