Sample inlet system for Bendix Mass Spectrometer
General view of a sample inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis.
|Creator of work|
|Rights||No Known Copyright|
|View in library catalog|
Bendix Corporation. “Sample Inlet System for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/sb3978571.
This citation is automatically generated and may contain errors.
RightsNo Known Copyright
Download selected image
Previous image shift + or , Next image shift + or . Pan image Zoom in + or shift + Zoom out - or shift + Zoom to fit 0 Close viewer esc Also
Mouse click to zoom in; shift-click to zoom out. Drag to pan. Pinch to zoom on touch.