Bendix Time-of-Flight Mass Analyzer
- 1970s
![](https://d3dkjx001zrum8.cloudfront.net/5bf5b1b5-1bf2-41bd-8cf5-71914de914da/thumb_large/6872a4dce9bf9084a5d65ec6b97c7264.jpg)
Rights
Download all 2 images
PDFZIPof full-sized JPGsDownload selected image
Small JPG1200 x 1477px — 223 KBFull-sized JPG1420 x 1748px — 293 KBOriginal fileTIFF — 1420 x 1748px — 7.1 MBTwo views of a Bendix Time-of-Flight Mass Analyzer designed for use with the Bendix Time-of-Flight Mass Spectrometer. A residual gas analyzer, commonly used to determine the total pressure of a vacuum chamber and the partial pressure of each residual gas component, is visible in the second photograph. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Property | Value |
---|---|
Creator of work | |
Format | |
Genre | |
Extent |
|
Subject | |
Rights | No Known Copyright |
Credit line |
|
Institutional location
Department | |
---|---|
Collection | |
Physical container |
|
View collection guide View in library catalog
Related Items
Cite as
Bendix Corporation. “Bendix Time-of-Flight Mass Analyzer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/z603qx82g.
This citation is automatically generated and may contain errors.