Two views of a Bendix Time-of-Flight Mass Analyzer designed for use with the Bendix Time-of-Flight Mass Spectrometer. A residual gas analyzer, commonly used to determine the total pressure of a vacuum chamber and the partial pressure of each residual gas component, is visible in the second photograph. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
|View in library catalog|
Bendix Corporation. “Bendix Time-of-Flight Mass Analyzer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/z603qx82g.
This citation is automatically generated and may contain errors.