This spectrometer tube was designed and built at RCA laboratories, Princeton, NJ in 1954 by Dr. Richard E. Honig (1917-2001) for pioneering work in the development of Secondary Ion Mass Spectrometry (SIMS) for solid surface analysis. The tube was presented to Dr. Richard E. Honig by his colleagues at RCA laboratories on the occasion of his retirement.
The SIMS technique is used to analyze the composition of solid surfaces and thin films. A focused beam sputters the sample to release surface particles; the ejected secondary ions are collected and analyzed. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface.
|Creator of work|
Gift of the Family of Dr. Richard E. Honig.
|Place of creation|
|Rights||Creative Commons Attribution 4.0 International License|
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