General view of a RCA Model EMU electron microscope used in the Naval Air Material Center's Aeronautical Materials Laboratory. Electron microscopes use a beam of accelerated electrons as a source of illumination and have a higher resolving power that, in contrast to light microscopes, can reveal the structure of smaller objects. Notably, the Model EMU debuted in 1944 and was the first American-manufactured RCA electron microscope capable of both imaging and electron diffraction.
|Creator of work|
|Original file type||TIFF|
|Rights||Public Domain Mark 1.0|
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Naval Air Material Center, and United States. Navy. “RCA Model EMU Electron Microscope in the Aeronautical Materials Laboratory,” 1958. Photographs from the Papers of J. Hartley Bowen, Box 1. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/h702q6403.
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