Interior view of ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the interior of an ion source for a Bendix Time-of-Flight Mass Spectrometer, with view of the ion grid and various circuit boards and plugs. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis.
| Property | Value |
|---|---|
| Creator of work | |
| Format | |
| Genre | |
| Extent |
|
| Subject | |
| Rights | No Known Copyright |
| Credit line |
|
Institutional location
| Department | |
|---|---|
| Collection | |
| Physical container |
|
Related Items
Cite as
Bendix Corporation. “Interior View of Ion Source for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/js956g184.
This citation is automatically generated and may contain errors.
