Ion source and oscilloscope for Bendix Mass Spectrometer
- 1970s
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Small JPG1200 x 981px — 150 KBLarge JPG2880 x 2353px — 724 KBFull-sized JPG4244 x 3468px — 1.4 MBOriginal fileTIFF — 4244 x 3468px — 42.1 MBAssorted views of the ion source and oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for qualitative and quantitative analysis. An oscilloscope is a laboratory instrument commonly used to display and analyze the waveform of electronic signals, in effect drawing a graph of the instantaneous signal voltage as a function of time. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Bendix Corporation. “Ion Source and Oscilloscope for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/k643b147n.
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