Diagram of sample inlet systems for Bendix Mass Spectrometer
- 1970s
Diagram depicting several sample inlet systems, including the fast reaction pinhole inlet, molecular beam inlet, and sample inlet tube, designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Cite as
Bendix Corporation. “Diagram of Sample Inlet Systems for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/m326m210m.
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