About Magazine Podcasts Events
Museum Hours:Wednesday–Saturday, 10AM–5PM

Digital Collections

Photographs

Sample inlet system for Bendix Mass Spectrometer

  • 1970s

Rights

No Known Copyright

Download selected image

PDFSmall JPG1200 x 1467px — 155 KBLarge JPG2880 x 3521px — 653 KBFull-sized JPG3484 x 4260px — 895 KBOriginal fileTIFF — 3484 x 4260px — 42.5 MB
View
No Known
Copyright
PDF
Download PDF

General view of a sample inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis.

Property Value
Creator of work
Photographer
Format
Genre
Extent
  • 10 in. H x 8 in. W
Subject
Rights No Known Copyright
Credit line
  • Courtesy of Science History Institute

Institutional location

Department
Collection
Physical container
  • Box 2

View in library catalog

Related Items

Cite as

Bendix Corporation. “Sample Inlet System for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/sb3978571.

  Export citation (RIS) ?

This citation is automatically generated and may contain errors.

The Science History Institute recognizes there are materials in our collections that may be offensive or harmful, containing racist, sexist, Eurocentric, ableist, or homophobic language or depictions. The history of science is not exempt from beliefs or practices harmful to traditionally marginalized groups. The Institute is engaged in ongoing efforts to responsibly present and address the evidence of oppression and injustice inextricable from the history of science. If you would like to learn more about our ongoing efforts or if you encounter harmful, inaccurate, or insufficient descriptions, please contact us at digital@sciencehistory.org.