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Sample inlet system for Bendix Mass Spectrometer

  • 1970s

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General view of a sample inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis.

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Extent
  • 10 in. H x 8 in. W
Subject
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  • Courtesy of Science History Institute

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Physical container
  • Box 2

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Cite as

Bendix Corporation. “Sample Inlet System for Bendix Mass Spectrometer,” 1970–1979. Photographs from the Bendix Time-of-Flight Mass Spectrometer Collection, Box 2. Science History Institute. Philadelphia. https://digital.sciencehistory.org/works/sb3978571.

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