Search Results
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5 items
Bendix Model 1030 Knudsen Cell Inlet System
- 1960s
Multiple views of the interior and exterior of the Bendix Model 1030 Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell…
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Accessory for Bendix Mass Spectrometer
- 1960s
General view of an unidentified accessory likely intended for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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Diagram related to Bendix Time-of-Flight Mass Spectrometer
- 1960s
Schematic diagram comparing the time-of-flight of an ion to its initial position in a Bendix Time-of-Flight Mass Spectromter. Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's…
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Diagram depicting energy focusing in Bendix Mass Spectrometer
- 1960s
Schematic diagram depicting energy focusing in a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry…
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Diagram depicting total output integrator time sequence
- 1960s
Schematic diagram depicting the total output integrator time sequence of a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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Thermal ionization spectrum diagram
- 1960s
Schematic diagram illustrating the thermal ionization spectrum of sodium and potassium. This diagram was likely produced using a Bendix Corporation thermal ionization probe, which, as part of the Bendix Time-of-Flight…
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Diagram depicting background spectrum reading for Bendix Mass Spectrometer
- 1960s
Schematic diagram depicting the typical background spectrum reading for a Bendix Time-of-Flight Mass Spectrometer with a thermal ionization probe in place. As part of the Bendix system, the thermal ionization probe…
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Diagram of Bendix Model 843T Thermal Ionization Probe
- 1960s
Schematic diagram of a Bendix Model 843T Thermal Ionization Probe designed for use with the Bendix Time-of-Flight Mass Spectrometer. This surface ionization inlet system provided a means of creating ions for spectral…
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Diagram of Bendix Mass Spectrometer
- 1970s
Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…
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Component of Bendix Mass Spectrometer
- 1960s
Close-up view of a component part, possibly a filament, of a Bendix Time-of-Flight Mass Spectrometer. A Fisher Scientific ruler is visible next to the component to indicate its size. The Time-of-Flight Mass Spectrometer…
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Bendix Knudsen Cell Inlet System
- 1960s
Interior view of the power supply of a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell Inlet…
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2 items
Components of Bendix Model 843A Direct Inlet System
- 1960s
Two close-up views of the filament and crucible of a Bendix Model 843A Direct Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Model 843A Direct…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Bendix Model 843A Direct Inlet System
- 1960s
Diagram of a Bendix Corporation Model 843A Direct Inlet System with view of assorted component parts, including a crucible, filament, vacuum system header, and sample probe. Inlet systems are typically used to introduce…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Two views of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Switch panel for Bendix Mass Spectrometer
- 1960s
Close-up view of the switch panel for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Chart recorder for Bendix Mass Spectrometer
- 1960s
General view of the back of a chart recorder for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Direct inlet probe system for Bendix Mass Spectrometer
- 1960s
General view of the direct inlet probe system designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the system include a vacuum system header, filament, crucible, and sample…
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Bendix Magnetic Electron Multiplier
- 1960s
Close-up view of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Residual gas analyzer for Bendix Mass Spectrometer
- 1960s
General view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…
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Ion source for Bendix Mass Spectrometer
- Circa 1971
Detail view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Main electronics chasis for Bendix Mass Spectrometer
- Circa 1971
General view of the interior of the main electronics chasis (enclosure) for a Bendix Corporation MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- Circa 1971
General and detail views of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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48 items
Corporate Board of Directors Visit to Beckman Instruments plant in Scotland
- 1960
This scrapbook documents a September 20, 1960 Board of Directors visit to the Beckman plant in Glenrothes, Fife in Scotland. The book contains a map and several photographs of news stories related to Beckman's Scotland…
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47 items
Glenrothes Bulletin
- 1960-Oct
The Glenrothes Bulletin Vol. 6, No. 8, October 1960 includes community news, letters to the editor, opinion pieces, advertisements, and, on page 17, an article about Beckman Instruments, Inc.'s 25th anniversary.
