Search Results
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Diagram of Bendix Model 843T Thermal Ionization Probe
- 1960s
Schematic diagram of a Bendix Model 843T Thermal Ionization Probe designed for use with the Bendix Time-of-Flight Mass Spectrometer. This surface ionization inlet system provided a means of creating ions for spectral…
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Diagram of Bendix Mass Spectrometer
- 1970s
Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…
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Component of Bendix Mass Spectrometer
- 1960s
Close-up view of a component part, possibly a filament, of a Bendix Time-of-Flight Mass Spectrometer. A Fisher Scientific ruler is visible next to the component to indicate its size. The Time-of-Flight Mass Spectrometer…
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Bendix Knudsen Cell Inlet System
- 1960s
Interior view of the power supply of a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell Inlet…
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2 items
Components of Bendix Model 843A Direct Inlet System
- 1960s
Two close-up views of the filament and crucible of a Bendix Model 843A Direct Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Model 843A Direct…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Bendix Model 843A Direct Inlet System
- 1960s
Diagram of a Bendix Corporation Model 843A Direct Inlet System with view of assorted component parts, including a crucible, filament, vacuum system header, and sample probe. Inlet systems are typically used to introduce…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Two views of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Switch panel for Bendix Mass Spectrometer
- 1960s
Close-up view of the switch panel for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Chart recorder for Bendix Mass Spectrometer
- 1960s
General view of the back of a chart recorder for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Direct inlet probe system for Bendix Mass Spectrometer
- 1960s
General view of the direct inlet probe system designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the system include a vacuum system header, filament, crucible, and sample…
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Bendix Magnetic Electron Multiplier
- 1960s
Close-up view of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Residual gas analyzer for Bendix Mass Spectrometer
- 1960s
General view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…
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Ion source for Bendix Mass Spectrometer
- Circa 1971
Detail view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Main electronics chasis for Bendix Mass Spectrometer
- Circa 1971
General view of the interior of the main electronics chasis (enclosure) for a Bendix Corporation MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- Circa 1971
General and detail views of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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48 items
Corporate Board of Directors Visit to Beckman Instruments plant in Scotland
- 1960
This scrapbook documents a September 20, 1960 Board of Directors visit to the Beckman plant in Glenrothes, Fife in Scotland. The book contains a map and several photographs of news stories related to Beckman's Scotland…
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47 items
Glenrothes Bulletin
- 1960-Oct
The Glenrothes Bulletin Vol. 6, No. 8, October 1960 includes community news, letters to the editor, opinion pieces, advertisements, and, on page 17, an article about Beckman Instruments, Inc.'s 25th anniversary.
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7 items
Notes for Lord Craigton's speech at Beckman Instruments, Inc.'s 25th anniversary dinner
- 1960-Sep
These notes, intended for distribution to the press, were used for a toast delivered by Lord Craigton, C.B.E., Minister of State for Scotland, on the occasion of Beckman Instruments, Inc.’s 25th Anniversary.
- Creator Of Work Scotland. Ministry of State
- Subject Factories, Scotland--Glenrothes, International trade, Beckman Instruments, Inc.
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5 items
Beckman Instruments, Inc. 25th Anniversary Dinner invitation
- 1960
An invitation to an anniversary dinner held on September 20, 1960 at the Caledonian Hotel in Edinburgh. In addition to a menu (featuring such delicacies as Tortue Verte Boulevard Pasadena and Soufflé Surprise à la…
- Creator Of Work Beckman Instruments, Inc.
- Subject Anniversaries, Menus, Beckman Instruments, Inc.
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70 items
The Beckman Model DU Spectrophotometer and Accessories Instruction Manual
- 1954
This manual appears to have been a well-used desk copy. The stained cover provides evidence of secondary usage as a coaster.
The first Beckman Instruments DU Spectrophotometer was developed in 1940, when the company…
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32 items
Beckman IR7 Infrared Spectrophotometer Instruction Manual
- 1958-Dec
The Beckman Instruments IR spectrophotometers began as a request from the Office of Rubber Reserve to Arnold O. Beckman in 1942, asking for an infrared spectrophotometer that they could use to create rubber. Under this…
- Creator Of Work Beckman Instruments, Inc.
- Subject Scientific apparatus and instruments, Spectrophotometer, Infrared spectroscopy, Beckman Instruments, Inc.
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48 items
Beckman Model DB Spectrophotometer Instruction Manual
- 1960
The Beckman DB spectrophotometer was a double beam model, which allowed for comparison between two light paths: a reference and the sample being measured.
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20 items
An Exhibit Prepared Under the Auspices of the National Research Council with the Cooperation of the Chemical War Service of the United States Army, Now Permanently Installed at the Smithsonian Institute, Washington D.C.
- 1921
Exhibition program for "The Chemical Exhibit" installed at the Smithsonian Institute in Washington, D.C. circa 1921. The central feature of the exhibit is a topographical model showing coal tar and other chemical…
- Author Howe, Harrison Estell, 1881-1942
- Contributor United States. Army. Chemical Warfare Service
- Creator Of Work National Research Council (U.S.)
- Publisher Chemical Foundation (U.S.)
- Subject Chemistry, Technical, Coal-tar products, Chemical warfare
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25 items
Naphtol AS on Rayon
- 1927
Sample book for Naphtol AS dyes, used for "embroidery purposes, for effects in silk, woollen and cotton clothes, for curtains, underwear made of artificial silk, etc." Contains dyeing instructions and 70 mounted dyed…
