Search Results
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2 items
Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
Two views of a Bendix MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical technique…
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Ion tube for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion tube for a Bendix Corporation Mass Spectrometer. The ion tube is a component part of the mass spectrometer's ion source, which produces a beam of particles characteristic of the sample material…
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3 items
Ion source for Bendix Mass Spectrometer
- 1960s
Three close-up views of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material…
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Bendix Time-of-Flight Mass Analyzer
- 1960s
Close-up view of the control panel for a Bendix Corporation Time-of-Flight Mass Analyzer. One of four component parts of a mass spectrometer, the mass analyzer is used to separate the particles of a sample material…
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2 items
Interior views of Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
Two partial views of the interior of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of the hot filament sample system control and assorted pumps. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…
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Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
General view of a Bendix MA-2 Time-of-Flight Mass Spectrometer system. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical…
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Control panel for Bendix Mass Spectrometer
- 1960s
Close-up view of the control panel of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of various components including the oscilloscope trace offset controller, cycle trigger, and output integrator. The…
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Ion source for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
General view of a Bendix MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical…
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Diagram depicting air spectrum on scope
- 1960s
Diagram depicting air spectrum on scope, showing readings for nitrogen gas, oxygen, and carbon dioxide. This diagram is likely the output of a Bendix Corporation Time-of-Flight Mass Spectrometer, an instrument commonly…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Bendix Mass Spectroscopy handling system
- 1960s
Promotional display depicting the Bendix Corporation Mass Spectroscopy handling system. One of four component parts of a mass spectrometer, the handling system is used to introduce an unknown substance into the…
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4 items
Bendix MA-3 Gas Chromatograph system with female model
- Circa 1971-Apr-13
Series of photographs depicting the Bendix MA-3 Gas Chromatograph system with a female model. Component parts visible in the photographs include a total output monitor, predynode gate generator, MA-1 Vacuum System, and…
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3 items
Bendix Gas Chromatograph and Mass Spectrometer
- 1960s
Series of photographs depicting the Bendix Corporation Gas Chromatograph 2500 and Time-of-Flight Mass Spectrometer with a male technician. Assorted control panels are visible in the photograph, including an isothermal…
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2 items
Bendix MA-2 Time-of-Flight Mass Spectrometer prototype
- 1960s – circa
Two views of a prototype of the Bendix MA-2 Time-of-Flight Mass Spectrometer, with a close-up of assorted control panels showing controls for the ionization gauge, inlet system pumping valve, thermocouple station, and…
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Bendix RGA-1A Time-of-Flight Residual Gas Analyzer with female model
- 1960s
General view of a Bendix RGA-1A Time-of-Flight Residual Gas Analyzer with female model. The Bendix RGA-1 was specifically designed and marketed to enable accurate determination of the total pressure of a vacuum chamber…
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4 items
Bendix MA-1A Time-of-Flight Mass Spectrometer
- 1960s
Series of photographs depicting the Bendix MA-1A Time-of-Flight Mass Spectrometer and a female model. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass…
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Ion source for Bendix Mass Spectrometer
- 1970s
General view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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2 items
Nude ion source for Bendix Mass Spectrometer
- Circa 1971
Two close-up views of the nude ion source for a Bendix Model MA-017 Time-of-Flight Mass Spectrometer. In the first photograph, the nude ion source is shown with a shipping cover over the apparatus. The Time-of-Flight…
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2 items
Accessory for Bendix Mass Spectrometer
- 1970-Dec
Two close-up views of an accessory designed for use with the Bendix Model MA-005 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…
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Residual gas analyzer for Bendix Mass Spectrometer
- 1970s
Close-up view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…
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2 items
Vacuum attachment for Bendix Mass Spectrometer
- 1970s
Two close-up views of the vacuum system attachment designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…
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3 items
Glass inlet system for Bendix Mass Spectrometer
- 1970s
Three views showing the interior and exterior of a glass inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion…
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5 items
Bendix Model MA-030 Mass Marker
- 1970s
Multiple views of the interior of a Bendix Corporation Model MA-030 Mass Marker designed for use with a Bendix Time-of-Flight Mass Spectrometer, with view of assorted circuits and wires. The Time-of-Flight Mass…
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2 items
Bendix Model MA-026 Mass Sequencer
- 1970s
Two views of a Model MA-026 Mass Sequencer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…
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Isolation valve for Bendix Knudsen Cell Inlet System
- 1960s
Close-up view of the isolation valve apparatus for a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen…
