Search Results
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Isolation valve for Bendix Knudsen Cell Inlet System
- 1960s
Close-up view of the isolation valve apparatus for a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen…
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5 items
Bendix Model 1030 Knudsen Cell Inlet System
- 1960s
Multiple views of the interior and exterior of the Bendix Model 1030 Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell…
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Accessory for Bendix Mass Spectrometer
- 1960s
General view of an unidentified accessory likely intended for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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Diagram related to Bendix Time-of-Flight Mass Spectrometer
- 1960s
Schematic diagram comparing the time-of-flight of an ion to its initial position in a Bendix Time-of-Flight Mass Spectromter. Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's…
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Diagram depicting energy focusing in Bendix Mass Spectrometer
- 1960s
Schematic diagram depicting energy focusing in a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry…
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Diagram depicting total output integrator time sequence
- 1960s
Schematic diagram depicting the total output integrator time sequence of a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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Thermal ionization spectrum diagram
- 1960s
Schematic diagram illustrating the thermal ionization spectrum of sodium and potassium. This diagram was likely produced using a Bendix Corporation thermal ionization probe, which, as part of the Bendix Time-of-Flight…
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Diagram depicting background spectrum reading for Bendix Mass Spectrometer
- 1960s
Schematic diagram depicting the typical background spectrum reading for a Bendix Time-of-Flight Mass Spectrometer with a thermal ionization probe in place. As part of the Bendix system, the thermal ionization probe…
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Diagram of Bendix Model 843T Thermal Ionization Probe
- 1960s
Schematic diagram of a Bendix Model 843T Thermal Ionization Probe designed for use with the Bendix Time-of-Flight Mass Spectrometer. This surface ionization inlet system provided a means of creating ions for spectral…
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Diagram of Bendix Mass Spectrometer
- 1970s
Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…
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Component of Bendix Mass Spectrometer
- 1960s
Close-up view of a component part, possibly a filament, of a Bendix Time-of-Flight Mass Spectrometer. A Fisher Scientific ruler is visible next to the component to indicate its size. The Time-of-Flight Mass Spectrometer…
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Bendix Knudsen Cell Inlet System
- 1960s
Interior view of the power supply of a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell Inlet…
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2 items
Components of Bendix Model 843A Direct Inlet System
- 1960s
Two close-up views of the filament and crucible of a Bendix Model 843A Direct Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Model 843A Direct…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Bendix Model 843A Direct Inlet System
- 1960s
Diagram of a Bendix Corporation Model 843A Direct Inlet System with view of assorted component parts, including a crucible, filament, vacuum system header, and sample probe. Inlet systems are typically used to introduce…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Two views of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Switch panel for Bendix Mass Spectrometer
- 1960s
Close-up view of the switch panel for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Chart recorder for Bendix Mass Spectrometer
- 1960s
General view of the back of a chart recorder for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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Direct inlet probe system for Bendix Mass Spectrometer
- 1960s
General view of the direct inlet probe system designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the system include a vacuum system header, filament, crucible, and sample…
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Bendix Magnetic Electron Multiplier
- 1960s
Close-up view of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…
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Residual gas analyzer for Bendix Mass Spectrometer
- 1960s
General view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…
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Ion source for Bendix Mass Spectrometer
- Circa 1971
Detail view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Main electronics chasis for Bendix Mass Spectrometer
- Circa 1971
General view of the interior of the main electronics chasis (enclosure) for a Bendix Corporation MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…
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2 items
Ion source for Bendix Mass Spectrometer
- Circa 1971
General and detail views of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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48 items
Corporate Board of Directors Visit to Beckman Instruments plant in Scotland
- 1960
This scrapbook documents a September 20, 1960 Board of Directors visit to the Beckman plant in Glenrothes, Fife in Scotland. The book contains a map and several photographs of news stories related to Beckman's Scotland…
