-
Bendix Model 2500 Gas Chromatograph
- 1970s
General view of a Bendix Corporation Model 2500 Gas Chromatograph and assorted accessories, including total output monitor, predynode gate generator, ionization gauge, and vacuum system.
-
Bendix Model MA-003 Total Output Monitor
- 1970s
Close-up view of the control panel of a Bendix Model MA-003 Total Output Monitor and Predynode Gate Generator designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass…
-
4 items
Accessories for Bendix Mass Spectrometer
- 1970s
Multiple views of assorted accessories, including a Model MA-006 Four Channel Monitor, a Time-of-Flight Mass Analyzer, and a Model GC-300 Ionization Gauge designed for use with the Bendix Corporation Time-of-Flight Mass…
-
Interior view of Bendix MA-015 Differential Pumping System
- 1970s
General view of the exposed interiors of four Bendix MA-015 Differential Pumping System units designed for use with the Bendix Time-of-Flight Mass Spectrometer. The vacuum systems on top of the units are wrapped,…
-
Ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
-
2 items
Bendix Time-of-Flight Mass Analyzer
- 1970s
Two close-up views of a Bendix Corporation Time-of-Flight Mass Analyzer and a Model MA-006 Four Channel Monitor designed for use with the Bendix Time-of-Flight Mass Spectrometer system. The Time-of-Flight Mass…
-
4 items
Bendix MA-015 Differential Pumping System
- 1970s
Four general views of the exterior and interior of a Bendix Model MA-015 Differential Pumping System and assorted control panels for various accessories attached to a Bendix Model MA-02 Time-of-Flight Mass Spectrometer…
-
Accessories for Bendix Mass Spectrometer
- 1970s
General view of assorted accessories, including a Model MA-006 Four Channel Monitor, a Time-of-Flight Mass Analyzer, and an oscilloscope designed for use with the Bendix Corporation Time-of-Flight Mass Spectrometer. The…
-
Ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
-
Control panel for oscilloscope used with Bendix Mass Spectrometer
- 1970s
Close-up view of the control panel of an oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer, the flagship instrument of the Bendix Corporation. An oscilloscope is a laboratory instrument…
-
Interior view of ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the interior of an ion source for a Bendix Time-of-Flight Mass Spectrometer, with view of the ion grid and various circuit boards and plugs. One of four component parts of a mass spectrometer, the ion…
-
Interior view of Bendix Corporation apparatus
- 1970s
Close-up view of the interior of an unidentified Bendix Corporation apparatus, likely a component of or accessory for a Time-of-Flight Mass Spectrometer, with view of various circuit boards and plugs. The Time-of-Flight…
-
Oscilloscope and inlet system for Bendix Mass Spectrometer
- 1970s
General view of assorted components of a Bendix Time-of-Flight Mass Spectrometer system, including an oscilloscope, inlet system, and ion source. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
-
Control panel for Bendix MA-3 Vacuum System
- 1970s
Close-up view of the control panel for a Bendix Corporation Model MA-3 Vacuum System designed for use with the Bendix Time-of-Flight Mass Spectrometer. An ionization gauge, foreline valve, and assorted attachments are…
-
Bendix Corporation Model MA-011 Variable Oscillator
- 1970s
General view of a Bendix Corporation MA-011 Variable Oscillator designed for use with a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
-
Ion source for Bendix Mass Spectrometer
- Circa 1971
Detail view of an ion source for a Bendix Model MA-2 Time-of-Flight Mass Spectrometer, with view of the one-quarter inch ionization region. One of four component parts of a mass spectrometer, the ion source produces a…
-
Ion source for Bendix Mass Spectrometer
- Circa 1971
General view of the interior of the ion source for a Bendix Corporation Mass Spectrometer, with view of the magnetic electron multiplier used to detect and amplify ion bunches or peaks. One of four component parts of a…
-
4 items
Ion source for Bendix Mass Spectrometer
- Circa 1971
Four views of assorted components of the Model MA-017 nude ion source and vacuum system for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of…
-
Interior view of Bendix MA-2 Time-of-Flight Mass Spectrometer
- Circa 1971
Close-up view of the interior of a Bendix MA-2 Time-of-Flight Mass Spectrometer showing the mercury diffusion pumping system contained in the analyzer console. The Time-of-Flight Mass Spectrometer (TOFMS) was the…
-
3 items
Ion source for Bendix Mass Spectrometer
- 1960s
Three views of the ion source and vacuum system for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
-
2 items
Bendix MA-1 Time-of-Flight Mass Spectrometer
- 1960s
Two views of the Bendix Corporation's MA-1 Time-of-Flight Mass Spectrometer, with view of the vacuum system and main electronics console. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
-
3 items
Bendix Gas Chromatograph and Mass Spectrometer system with female model
- 1960s
Three views of a Bendix Corporation Gas Chromatograph and Mass Spectrometer system with a female model. Various components of the two instruments are visible, including the isothermal controller, temperature programmer,…
-
2 items
Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1960s
Two views of a Bendix MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
Mass spectrometry is an analytical technique…
-
Ion tube for Bendix Mass Spectrometer
- 1960s
Close-up view of the ion tube for a Bendix Corporation Mass Spectrometer. The ion tube is a component part of the mass spectrometer's ion source, which produces a beam of particles characteristic of the sample material…
-
3 items
Ion source for Bendix Mass Spectrometer
- 1960s
Three close-up views of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material…