Schematic diagram depicting energy focusing in a Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

Mass spectrometry…

Schematic diagram depicting the total output integrator time sequence of a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…

Schematic diagram illustrating the thermal ionization spectrum of sodium and potassium. This diagram was likely produced using a Bendix Corporation thermal ionization probe, which, as part of the Bendix Time-of-Flight…

Schematic diagram depicting the typical background spectrum reading for a Bendix Time-of-Flight Mass Spectrometer with a thermal ionization probe in place. As part of the Bendix system, the thermal ionization probe…

Schematic diagram of a Bendix Model 843T Thermal Ionization Probe designed for use with the Bendix Time-of-Flight Mass Spectrometer. This surface ionization inlet system provided a means of creating ions for spectral…

Schematic diagram of a section of a Bendix Time-of-Flight Mass Spectrometer, with view of the shock tube, oscilloscope, and attachment for a Knudsen cell or direct inlet system. The diagram is captioned "versatility,"…

Close-up view of a component part, possibly a filament, of a Bendix Time-of-Flight Mass Spectrometer. A Fisher Scientific ruler is visible next to the component to indicate its size. The Time-of-Flight Mass Spectrometer…

Interior view of the power supply of a Bendix Corporation Knudsen Cell Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Knudsen Cell Inlet…

Two close-up views of the filament and crucible of a Bendix Model 843A Direct Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Model 843A Direct…

Diagram of a Bendix Corporation Model 843A Direct Inlet System with view of assorted component parts, including a crucible, filament, vacuum system header, and sample probe. Inlet systems are typically used to introduce…

Two views of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…

Close-up view of the switch panel for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.

General view of the back of a chart recorder for a Bendix Corporation Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix Corporation.
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General view of the direct inlet probe system designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the system include a vacuum system header, filament, crucible, and sample…

Close-up view of a Bendix Corporation Magnetic Electron Multiplier designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…

Close-up view of the ion source for a Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample material for…

General view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…

Detail view of a portion of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…

General view of the interior of the main electronics chasis (enclosure) for a Bendix Corporation MA-2 Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument…

General and detail views of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…