Search Results
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up partial view of the ion source and vacuum system attachment designed for use with a Bendix Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze the…
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4 items
Interior view of Bendix Mass Spectrometer component
- 1970s
Four views of the interior of a component of a Bendix Time-of-Flight Mass Spectrometer, with view of the pumping system and assorted wires. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
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Ion source for Bendix Mass Spectrometer
- 1970s
General view of the interior of the ion source for a Bendix Corporation Mass Spectrometer, with view of the magnetic electron multiplier used to detect and amplify ion bunches or peaks. One of four component parts of a…
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2 items
Bendix Model 1111 Time-of-Flight Mass Spectrometer
- 1970s
Two views of a Bendix Model 1111 Time-of-Flight Mass Spectrometer, with view of the ion source and assorted control panels. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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2 items
Bendix Model 12-101A Mass Spectrometer
- Circa 1970
Two views of a Bendix Model 12-101A Time-of-Flight Mass Spectrometer, with view of the ion source, vacuum system, and assorted control panels and gauges. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship…
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Ion source for Bendix Mass Spectrometer
- 1970s
Side view of the ion source and attachment apparatus for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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Bendix Model 1111 Time-of-Flight Mass Spectrometer
- 1970s
General view of a Bendix Model 1111 Time-of-Flight Mass Spectrometer, with view of the ion source and assorted control panels. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the…
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Bendix Time-of-Flight Mass Spectrometer
- 1970s
General view of a Bendix Corporation Time-of-Flight Mass Spectrometer, with view of assorted control panels and component apparatus, including the ion source, vacuum system, and thermocouple and ionization gauges. The…
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Ion source for Bendix Mass Spectrometer
- 1970s
Side view of the ion source and attachment apparatus for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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Bendix Model 923 Sample Inlet System
- 1970s
General view of a Bendix Corporation Model 923 Sample Inlet System designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce samples into a mass spectrometer's ion…
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Bendix Model 1076A Chromatograph Manifold Inlet System
- 1970s
General view of the control panel of a Bendix Corporation Model 1076A Chromatograph Manifold Inlet System designed for use with a Bendix Time-of-Flight Mass Spectrometer. Inlet systems are typically used to introduce…
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Sample inlet system for Bendix Mass Spectrometer
- 1970s
General view of a sample inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically used to introduce samples…
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2 items
Glass tubes for Bendix Mass Spectrometer
- 1970s
Two views of assorted glass tubes presumably designed for use with the Bendix Time-of-Flight Mass Spectrometer system. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation, Glassware
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Accessory for Bendix Mass Spectrometer
- 1970s
Detail view of a metal joint presumably used to attach component parts of a Bendix Time-of-Flight Mass Spectrometer system. A numbered dial with visible on the right-hand side of the joint. The Time-of-Flight Mass…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation, Mass spectrometers
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Quadrupole Model 1100A Controller
- 1970s
Close-up view of the control panel of a Quadrupole Model 1100A Controller designed for use with a Bendix TIme-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
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Bendix MA-003 Time-of-Flight Mass Spectrometer
- 1970s
General view of a Bendix Model MA-003 Time-of-Flight Mass Spectrometer, with view of assorted control panels and component apparatus, including a variable oscillator, ionization gauge, vacuum control panel, and output…
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Accessories for Bendix Mass Spectrometer
- 1970s
General view of unidentified accessories designed for use with a Bendix Time-of-Flight Mass Spectrometer. Several of the accessories appear to be wrapped in foil. The Time-of-Flight Mass Spectrometer (TOFMS) was the…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source and vacuum system attachment designed for use with a Bendix Model MA-3A Time-of-Flight Mass Spectrometer, with partial view of the oscilloscope. The Time-of-Flight Mass Spectrometer…
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Bendix Model 843A Direct Inlet System
- 1970s
General view of Bendix Model 843A Direct Inlet System. Inlet systems are typically used to introduce samples into a mass spectrometer's ion source for analysis. The Model 843A Direct Inlet System was designed for high…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source and vacuum system attachment designed for use with a Bendix Model MA-004 Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze…
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4 items
Component of ion source for Bendix Mass Spectrometer
- 1970s
Multiple close-up views of a component part, possibly accelerating grids, of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four primary components of a mass spectrometer, the ion…
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4 items
Grid ion source for Bendix Mass Spectrometer
- 1973-Jun
Multiple close-up views of the grid ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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3 items
Interior of unit for Bendix Mass Spectrometer system
- 1970s
Three general views of the exposed interior of a component unit of the Bendix Corporation Time-of-Flight Mass Spectrometer system, with view of assorted vacuum pumps and attachments. The Time-of-Flight Mass Spectrometer…
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4 items
Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1970s
Multiple views of a Bendix MA-2 Time-of-Flight Mass Spectrometer, with view of assorted accessories and components, including the ion source, vacuum system, variable oscillator, and output scanner. The Time-of-Flight…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Spectrometer industry, Mass spectrometry, Bendix Corporation, Mass spectrometers
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7 items
Bendix MA-2 Time-of-Flight Mass Spectrometer
- 1970s
Miscellaneous exterior and interior views of a Bendix Model MA-2 Time-of-Flight Mass Spectrometer, with view of assorted control panels and component apparatus, including a variable oscillator, ionization gauge, vacuum…
