This collection consists of photographs documenting the creation, production, and marketing of the Bendix Corporation's flagship analytical instrument, the Time-of-Flight Mass Spectrometer (TOFMS), predominantly dating from the 1960s and 1970s. Photographs of different models of the TOFMS and its various component parts, including mass sequencers, cell sample inlet systems, respiratory gas analyzers, and magnetic electron multipliers, make up the bulk of the collection, with a small subset of photographs devoted to gas chromatographs. By and large, the photographs are staged publicity images used for advertising and manuals and only a few photographs capture the instruments in use in a laboratory setting. Photographs of the Bendix Corporation and sales booths of competing companies at the 1973 PITTCON round out the collection.
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3 items
System Industries System/150 unit and accessories
- 1980s
Three views of a System Industries System/150 unit and accessories, including a computer monitor, keyboard, and printer. This unit may have been intended for use with a Bendix Corporation Time-of-Flight Mass…
- Creator Of Work Bendix Corporation
- Subject Scientific apparatus and instruments, Bendix Corporation
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Consolidated Vacuum Corporation Model 2000 Mass Spectrometer
- 1982-Mar
General view of a Consolidated Vacuum Corporation Model 2000 Mass Spectrometer, with view of the output scanner, oscilloscope, and assorted control panels and wires. Also known as CVC Products Inc., Consolidated Vacuum…
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3 items
Vacuum system attachment for Bendix Thermocouple Gauge
- 1970s
Three views of a vacuum system attachment for a Bendix Corporation Thermocouple Gauge. The attachment appears to have been used to attach the thermocouple gauge to the vacuum system of a Bendix Time-of-Flight Mass…
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2 items
Vacuum attachment for Bendix Mass Spectrometer
- 1970s
Two close-up views of the vacuum system attachment designed for use with the Bendix Time-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical instrument of the Bendix…
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Sample inlet system for Bendix Mass Spectrometer
- 1970s
General view of a sample inlet system designed for use with a Bendix Time-of-Flight Mass Spectrometer, the flagship analytical instrument of the Bendix Corporation. Inlet systems are typically used to introduce samples…
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Residual gas analyzer for Bendix Mass Spectrometer
- 1970s
Close-up view of a residual gas analyzer designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Component parts of the analyzer include an ion source, drift tube, magnetic electron multiplier, and…
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Quadrupole Model 1100A Controller
- 1970s
Close-up view of the control panel of a Quadrupole Model 1100A Controller designed for use with a Bendix TIme-of-Flight Mass Spectrometer. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
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Pumping system for Bendix Mass Spectrometer
- 1970s
Close-up view of a pumping system designed for use with a Bendix TIme-of-Flight Mass Spectrometer, with view of the vacuum control panel and Model GIC-300 Ionization Gauge. The Time-of-Flight Mass Spectrometer (TOFMS)…
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Plug box and ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of a plug box and ion source designed for use with a Bendix Corporation MA-1 Time-of-Flight Mass Spectrometer. Per notations accompanying the photograph, these components were intended for use as…
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Output scanner for Bendix Mass Spectrometer
- 1970s
Close-up view of an output scanner designed for use with a Bendix Corporation Time-of-Flight Mass Spectrometer. Per notations accompanying the photograph, this output scanner was intended for use as a replacement part…
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Oscilloscope and inlet system for Bendix Mass Spectrometer
- 1970s
General view of assorted components of a Bendix Time-of-Flight Mass Spectrometer system, including an oscilloscope, inlet system, and ion source. The Time-of-Flight Mass Spectrometer (TOFMS) was the flagship analytical…
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Ion source for Bendix Mass Spectrometer
- 1970s
General view of the interior of the ion source for a Bendix Corporation Mass Spectrometer, with view of the magnetic electron multiplier used to detect and amplify ion bunches or peaks. One of four component parts of a…
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Ion source for Bendix Mass Spectrometer
- 1970s
Side view of the ion source and attachment apparatus for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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Ion source for Bendix Mass Spectrometer
- 1970s
General view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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3 items
Ion source for Bendix Mass Spectrometer
- 1970s
Three views of the interior of the ion source for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Ion source for Bendix Mass Spectrometer
- 1970s
Side view of the ion source and attachment apparatus for a Bendix Corporation Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the…
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Ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of the sample…
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source and vacuum system attachment designed for use with a Bendix Model MA-004 Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze…
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up partial view of the ion source and vacuum system attachment designed for use with a Bendix Time-of-Flight Mass Spectrometer. An oscilloscope, a laboratory instrument commonly used to display and analyze the…
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Ion source and vacuum system for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source and vacuum system attachment designed for use with a Bendix Model MA-3A Time-of-Flight Mass Spectrometer, with partial view of the oscilloscope. The Time-of-Flight Mass Spectrometer…
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Ion source and oscilloscope for Bendix Mass Spectrometer
- 1970s
Close-up view of an ion source and oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles…
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4 items
Ion source and oscilloscope for Bendix Mass Spectrometer
- 1970s
Assorted views of the ion source and oscilloscope designed for use with the Bendix Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles…
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Ion source and ion gauge for Bendix Mass Spectrometer
- 1970s
Close-up view of the ion source and ion gauge for a Bendix Corporation Time-of-Flight Mass Spectrometer. One of four component parts of a mass spectrometer, the ion source produces a beam of particles characteristic of…
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Interior view of ion source for Bendix Mass Spectrometer
- 1970s
Close-up view of the interior of an ion source for a Bendix Time-of-Flight Mass Spectrometer, with view of the ion grid and various circuit boards and plugs. One of four component parts of a mass spectrometer, the ion…